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Microscopy and Microanalysis is a peer-reviewed journal published by Oxford University Press, covering Electron and X-Ray Spectroscopy Techniques, Advanced Electron Microscopy Techniques and Applications, Advanced Materials Characterization Techniques.
| Publisher | Oxford University Press |
|---|---|
| Reference style | Author–year (OUP) Author–year — (Smith, 2023) in the text Smith, A., Jones, B. and Lee, C. (2023) 'A representative article title', Microscopy and Microanalysis, 12(3), pp. 45–58.
Formats any DOI in the closest standard style — Microscopy and Microanalysis has no published style definition, so this is an approximation. No sign-up. |
| Publishes research in | Electron and X-Ray Spectroscopy Techniques Advanced Electron Microscopy Techniques and Applications Advanced Materials Characterization Techniques Ion-surface interactions and analysis Integrated Circuits and Semiconductor Failure Analysis |
| ISSN | 1431-9276 |
| Citation impact (2-yr) | 0.66 |
| h-index | 94 |
| i10-index | 2,157 |
| Total citations | 100,973 |
| Article processing charge | $3,255 |
| Top institutions publishing here | Oak Ridge National Laboratory |
| Journal website | academic.oup.com |
| You get | A submission-ready PDF and the editable LaTeX source — ready to submit. |
Citations each year’s papers have accumulated so far — the most recent years are still building up.
Since the automation of the electron backscatter diffraction (EBSD) technique, EBSD systems have become commonplace in microscopy facilities within materials science and geology research laboratories around the world. The acceptance of the technique is primarily due to the capability of EBSD to aid the research scientist in understanding the crystallographic aspects of microstructure. There has…
Scanning transmission electron microscopy (STEM) is widely used for imaging, diffraction, and spectroscopy of materials down to atomic resolution. Recent advances in detector technology and computational methods have enabled many experiments that record a full image of the STEM probe for many probe positions, either in diffraction space or real space. In this paper, we…
The three-dimensional (3D) atom-probe technique produces a reconstruction of the elemental chemical identities and three-dimensional positions of atoms field evaporated from a sharply pointed metal specimen, with a local radius of curvature of less than 50 nm. The number of atoms collected can be on the order of one million, representing an analysis volume of…
Journal Article SerialEM: A Program for Automated Tilt Series Acquisition on Tecnai Microscopes Using Prediction of Specimen Position Get access David N Mastronarde David N Mastronarde Boulder Laboratory for Three Dimensional Electron Microscopy of Cells, Dept. of Molecular, Cellular, and Developmental Biology, University of Colorado, Boulder, CO 80309 Search for other works by this author…
We describe a hybrid pixel array detector (electron microscope pixel array detector, or EMPAD) adapted for use in electron microscope applications, especially as a universal detector for scanning transmission electron microscopy. The 128×128 pixel detector consists of a 500 µm thick silicon diode array bump-bonded pixel-by-pixel to an application-specific integrated circuit. The in-pixel circuitry provides…
