Abstract A compilation is presented of all published measurements of electron inelastic mean free path lengths in solids for energies in the range 0–10 000 eV above the Fermi level. For analysis, the materials are grouped under one of the headings: element, inorganic compound, organic compound and adsorbed gas, with the path lengths each time…
Surface and Interface Analysis Template
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About the Surface and Interface Analysis format
Surface and Interface Analysis is a peer-reviewed journal published by Wiley, covering Electron and X-Ray Spectroscopy Techniques, Ion-surface interactions and analysis, Semiconductor materials and devices.
| Publisher | Wiley |
|---|---|
| Reference style | Author–year (Chicago) Author–year — (Smith, 2023) in the text Smith, Ada, Ben Jones, and Cara Lee. 2023. "A Representative Article Title." Surface and Interface Analysis 12 (3): 45–58.
Formats any DOI in Surface and Interface Analysis style. No sign-up. |
| Publishes research in | Electron and X-Ray Spectroscopy Techniques Ion-surface interactions and analysis Semiconductor materials and devices X-ray Spectroscopy and Fluorescence Analysis Metal and Thin Film Mechanics |
| ISSN | 0142-2421 |
| Citation impact (2-yr) | 2.55 |
| h-index | 139 |
| i10-index | 4,073 |
| Total citations | 191,553 |
| Article processing charge | $3,350 |
| Top institutions publishing here | Centre National de la Recherche Scientifique |
| Journal website | onlinelibrary.wiley.com |
| You get | A submission-ready PDF and the editable LaTeX source — ready to submit. |
Papers published in Surface and Interface Analysis per year
Citation impact of Surface and Interface Analysis by publication year
Citations each year’s papers have accumulated so far — the most recent years are still building up.
Most-cited papers in Surface and Interface Analysis
Abstract Ferrous (Fe 2+ ) and ferric (Fe 3+ ) compounds were investigated by XPS to determine the usefulness of calculated multiplet peaks to fit high‐resolution iron 2p 3/2 spectra from high‐spin compounds. The multiplets were found to fit most spectra well, particularly when contributions attributed to surface peaks and shake‐up satellites were included. This…
Abstract We report calculations of electron inelastic mean free paths (IMFPs) of 50–2000 eV electrons for a group of 14 organic compounds: 26‐ n ‐paraffin, adenine, β‐carotene, bovine plasma albumin, deoxyribonucleic acid, diphenylhexatriene, guanine, kapton, polyacetylene, poly(butene‐1‐sulfone), polyethylene, polymethylmethacrylate, polystyrene and poly(2‐vinylpyridine). The computed IMFPs for these compounds showed greater similarities in magnitude and in…
Chemical state X‐ray photoelectron spectroscopic analysis of copper species is challenging because of the complexity of the 2p spectra resulting from shake‐up structures for Cu(II) species and overlapping binding energies for Cu metal and Cu(I) species. This paper builds upon and extends previously published X‐ray photoelectron spectroscopy curve‐fitting and data analysis procedures for a wide…
Abstract Quantitative information from electron spectroscopy for chemical analysis requires the use of suitable atomic sensitivity factors. An empirical set has been developed, based upon data from 135 compounds of 62 elements. Data upon which the factors are based are intensity ratios of spectral lines with F1s as a primary standard, value unity, and K2p…