Wiley

Journal of Electron Microscopy Technique Template

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About the Journal of Electron Microscopy Technique format

Journal of Electron Microscopy Technique is a peer-reviewed journal published by Wiley, covering Electron and X-Ray Spectroscopy Techniques, Advanced Electron Microscopy Techniques and Applications, Anodic Oxide Films and Nanostructures.

PublisherWiley
Reference styleAuthor–year (Chicago)
Author–year — (Smith, 2023) in the text
Smith, Ada, Ben Jones, and Cara Lee. 2023. "A Representative Article Title." Journal of Electron Microscopy Technique 12 (3): 45–58.

Formats any DOI in Journal of Electron Microscopy Technique style. No sign-up.

Publishes research inElectron and X-Ray Spectroscopy Techniques Advanced Electron Microscopy Techniques and Applications Anodic Oxide Films and Nanostructures Electrocatalysts for Energy Conversion Molecular Biology Techniques and Applications
ISSN0741-0581
h-index57
i10-index337
Total citations17,249
Top institutions publishing hereArizona State University
You getA submission-ready PDF and the editable LaTeX source — ready to submit.

Papers published in Journal of Electron Microscopy Technique per year

105
1985
103
1986
155
1987
137
1988
161
1989
144
1990
177
1991
1
2007
1
2010
1
2012
1
2014
1
2016

Citation impact of Journal of Electron Microscopy Technique by publication year

910
1985
1.4K
1986
1.4K
1987
4.1K
1988
2.1K
1989
2.7K
1990
2.8K
1991
5
2007
0
2010
1
2012
0
2014
35
2016

Citations each year’s papers have accumulated so far — the most recent years are still building up.

Most-cited papers in Journal of Electron Microscopy Technique

EELS log‐ratio technique for specimen‐thickness measurement in the TEM

T. Malis, Shangcong Cheng, R.F. Egerton · 1 Feb 1988

We discuss measurement of the local thickness t of a transmission microscope specimen from the log-ratio formula t = lambda ln (It/I0) where It and I0 are the total and zero-loss areas under the electron-energy loss spectrum. We have measured the total inelastic mean free path lambda in 11 materials of varying atomic number Z…

Controlled environment vitrification system: An improved sample preparation technique

Jayesh Bellare, H. T. Davis, L. E. Scriven et al. · 1 Sep 1988

The controlled environment vitrification system (CEVS) permits cryofixation of hydrated biological and colloidal dispersions and aggregates from a temperature- and saturation-controlled environment. Otherwise, specimens prepared in an uncontrolled laboratory atmosphere are subject to evaporation and heat transfer, which may introduce artifacts caused by concentration, pH, ionic strength, and temperature changes. Moreover, it is difficult to…

The preparation of cross‐section specimens for transmission electron microscopy

J. C. Bravman, Robert Sinclair · 1 Jan 1984

Abstract The structure and chemistry of thin solid films are best studied by transmission electron microscopy (TEM) when they are viewed in cross‐section—that is, when the surface normal of the film is made perpendicular to the electron beam. In this orientation, the substrate, the thin film layers, and the interfaces between them can be imaged…

Three‐Dimensional reconstruction of single particles from random and nonrandom tilt series

Michael Radermacher · 1 Aug 1988

To overcome the radiation damage-induced limitations to the resolution of three-dimensional reconstructions from electron microscopic tilt series, novel reconstruction schemes have been developed that require only a single exposure of the specimen. The tilt series collected with these methods have random projection directions. First, three-dimensional reconstruction techniques are described that are applicable to data obtained…

Protein A‐gold electron microscopic immunocytochemistry: Methods, applications, and limitations

Moı̈se Bendayan · 1 Jan 1984

Abstract The postembedding protein A‐gold immunocytochemical approach has been introduced as an alternative to other techniques for the ultrastructural localization of antigenic sites. The present review deals with the development, the theoretical background, and technical approach of the protein A‐gold method as well as the different modifications introduced in order to enhance the resolution of…

Journal of Electron Microscopy Technique template — frequently asked questions

How do I write a paper in the Journal of Electron Microscopy Technique format?
In DocuGuru you write your manuscript in a normal editor — no LaTeX setup required — and select the Journal of Electron Microscopy Technique template. When you export, DocuGuru compiles the paper into the official Wiley format and hands you a submission-ready PDF along with the editable LaTeX source.
What reference style does Journal of Electron Microscopy Technique use?
Journal of Electron Microscopy Technique uses Author–year (Chicago) references, shown as author–year markers such as (Smith, 2023) in the text. DocuGuru formats every in-text citation and the reference list in this exact style automatically. A reference appears like this: Smith, Ada, Ben Jones, and Cara Lee. 2023. "A Representative Article Title." Journal of Electron Microscopy Technique 12 (3): 45–58.
Do I need to know LaTeX to submit to Journal of Electron Microscopy Technique?
No. DocuGuru generates the USG LaTeX class and compiles the PDF for you in the background, so you get a Wiley-ready Journal of Electron Microscopy Technique document without writing any LaTeX. If you do want it, the LaTeX source is included in the export.
Can I import an existing draft into the Journal of Electron Microscopy Technique template?
Yes. Paste or upload your current manuscript — Word, LaTeX, Markdown, or plain text — and DocuGuru reflows it into the Journal of Electron Microscopy Technique format with correct headings, figures, tables, and author–year citations.
Who publishes Journal of Electron Microscopy Technique?
Journal of Electron Microscopy Technique is a multidisciplinary journal published by Wiley. DocuGuru's Journal of Electron Microscopy Technique template matches Wiley's official submission format.
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Yes — DocuGuru produces a PDF built with the official Journal of Electron Microscopy Technique template (the USG class) that is ready to submit to Wiley, together with the matching LaTeX source files.
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