The definitions for important Rietveld error indices are defined and discussed. It is shown that while smaller error index values indicate a better fit of a model to the data, wrong models with poor quality data may exhibit smaller values error index values than some superb models with very high quality data.
Powder Diffraction Template
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About the Powder Diffraction format
Powder Diffraction is a peer-reviewed journal published by Cambridge University Press, covering X-ray Diffraction in Crystallography, Diverse Scientific and Economic Studies, Crystallography and molecular interactions.
| Publisher | Cambridge University Press |
|---|---|
| Reference style | Numbered Numbered — [1], [2] in the text [1] A. Smith, B. Jones, and C. Lee, A representative article title, Powder Diffraction 12 (2023) 45–58.
Formats any DOI in the closest standard style — Powder Diffraction has no published style definition, so this is an approximation. No sign-up. |
| Publishes research in | X-ray Diffraction in Crystallography Diverse Scientific and Economic Studies Crystallography and molecular interactions Human auditory perception and evaluation X-ray Spectroscopy and Fluorescence Analysis |
| ISSN | 0885-7156 |
| Citation impact (2-yr) | 2.44 |
| h-index | 71 |
| i10-index | 602 |
| Total citations | 32,069 |
| Top institutions publishing here | International Centre for Diffraction Data |
| Journal website | www.cambridge.org |
| You get | A submission-ready PDF and the editable LaTeX source — ready to submit. |
Papers published in Powder Diffraction per year
Citation impact of Powder Diffraction by publication year
Citations each year’s papers have accumulated so far — the most recent years are still building up.
Most-cited papers in Powder Diffraction
The ICDD's Powder Diffraction File ™ (PDF ® ) is a database of inorganic and organic diffraction data used for phase identification and materials characterization by powder diffraction. The PDF has been available for over 75 years and finds application in X-ray, synchrotron, electron, and neutron diffraction analyses. With entries based on powder and single…
HighScore with the Plus option (HighScore Plus) is the commercial powder diffraction analysis software from PANalytical. It has been in constant development over the last 13 years and has evolved into a very complete and mature product. In this paper, we present a brief overview of the suite focusing on the latest additions and its…
Methods extracting fast all the peak intensities from a complete powder diffraction pattern are reviewed. The genesis of the modern whole powder pattern decomposition methods (the so-called Pawley and Le Bail methods) is detailed and their importance and domains of application are decoded from the most cited papers citing them. It is concluded that these…
Abstract The Reference Intensity Ratio (RIR) is a general, instrument-independent constant for use in quantitative phase analysis by the X-ray powder diffraction internal standard method. When the reference standard is corundum, RIR is known as I/I c ; These constants are collected in the Powder Diffraction File (1987), can be calculated, and can be measured.…