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Surface Review and Letters is a peer-reviewed journal published by World Scientific, covering Advanced Chemical Physics Studies, Metal and Thin Film Mechanics, Surface and Thin Film Phenomena.
| Publisher | World Scientific |
|---|---|
| Reference style | Superscript numbered (World Scientific) Superscript — small raised numerals in the text 1. Smith, A., Jones, B. & Lee, C. A representative article title. Surface Review and Letters 12, 45–58 (2023).
Formats any DOI in the closest standard style — Surface Review and Letters has no published style definition, so this is an approximation. No sign-up. |
| Publishes research in | Advanced Chemical Physics Studies Metal and Thin Film Mechanics Surface and Thin Film Phenomena Electron and X-Ray Spectroscopy Techniques Semiconductor materials and devices |
| ISSN | 0218-625X |
| Citation impact (2-yr) | 0.91 |
| h-index | 57 |
| i10-index | 840 |
| Total citations | 31,236 |
| Top institutions publishing here | Shandong University |
| Journal website | www.worldscientific.com |
| You get | A submission-ready PDF and the editable LaTeX source — ready to submit. |
Citations each year’s papers have accumulated so far — the most recent years are still building up.
At present the only surface electron microscope which allows true characteristic XPEEM (photoemission electron microscopy using synchrotron radiation) and structural characterization is the spectroscopic LEEM developed at the Technical University Clausthal in the early nineties. This instrument has in the past been used mainly for LEEM studies of various surface and thin film phenomena, because…
Reverse micelles as nanosized aqueous droplets existing at certain compositions of water-in-oil microemulsions are widely used today in the synthesis of many types of nanoparticles. However, without a rich conceptual network that would correlate the properties and compositions of reverse micellar microemulsions to the properties of to-be-obtained particles, the design procedures in these cases usually…
Although particle size and its measurement are intuitively familiar to particle technologists, the concept of point of zero charge (pzc) is less widely understood and applied. This is unfortunate since it is at least as fundamentally important as particle size in determining the behavior of particulate materials, especially those with sizes in the colloidal range…
A review is given of the principles underlying X-ray magnetic circular (XMCD) and linear (XMLD) dichroism spectromicroscopies consisting of polarized X-ray absorption spectroscopy in conjunction with scanning or imaging microscopy. The techniques are shown to have many useful and important capabilities for the study of complex magnetic materials. They offer elemental specificity, chemical specificity and…
A direct determination of the fractal dimensions of a fracture surface is essential for a better understanding of its complete topographic characteristics. In this paper, a laser profilometer is employed to measure the topography of a rock's fracture surface. With the use of the triangular prism surface area and projective covering methods, the resultant data…
