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Advanced Structural and Chemical Imaging is a peer-reviewed journal published by Springer Nature, covering Advanced Electron Microscopy Techniques and Applications, Electron and X-Ray Spectroscopy Techniques, Advanced X-ray Imaging Techniques.
| Publisher | Springer Nature |
|---|---|
| Reference style | Numbered (Springer) Numbered — [1], [2] in the text 1. Smith, A., Jones, B., Lee, C.: A representative article title. Advanced Structural and Chemical Imaging 12, 45–58 (2023)
Formats any DOI in Advanced Structural and Chemical Imaging style. No sign-up. |
| Publishes research in | Advanced Electron Microscopy Techniques and Applications Electron and X-Ray Spectroscopy Techniques Advanced X-ray Imaging Techniques Integrated Circuits and Semiconductor Failure Analysis Medical Imaging Techniques and Applications |
| ISSN | 2198-0926 |
| h-index | 29 |
| i10-index | 59 |
| Total citations | 3,039 |
| Top institutions publishing here | Oak Ridge National Laboratory |
| Journal website | ascimaging.springeropen.com |
| You get | A submission-ready PDF and the editable LaTeX source — ready to submit. |
Citations each year’s papers have accumulated so far — the most recent years are still building up.
Abstract Many microscopic investigations of materials may benefit from the recording of multiple successive images. This can include techniques common to several types of microscopy such as frame averaging to improve signal-to-noise ratios (SNR) or time series to study dynamic processes or more specific applications. In the scanning transmission electron microscope, this might include focal…
Scanning transmission electron microscopy (STEM) data with atomic resolution can contain a large amount of information about the structure of a crystalline material. Often, this information is hard to extract, due to the large number of atomic columns and large differences in intensity from sublattices consisting of different elements. In this work, we present a…
Abstract Image simulation for scanning transmission electron microscopy at atomic resolution for samples with realistic dimensions can require very large computation times using existing simulation algorithms. We present a new algorithm named PRISM that combines features of the two most commonly used algorithms, namely the Bloch wave and multislice methods. PRISM uses a Fourier interpolation…
Abstract When considering the acquisition of experimental synchrotron radiation (SR) X-ray CT data, the reconstruction workflow cannot be limited to the essential computational steps of flat fielding and filtered back projection (FBP). More refined image processing is often required, usually to compensate artifacts and enhance the quality of the reconstructed images. In principle, it would…
Abstract Scanning transmission electron microscopy (STEM) excels in accessing atomic-scale structure and chemistry. Enhancing our ability to directly image the functionalities of local features in materials has become one of the most important topics in the future development of STEM. Recently, differential phase contrast (DPC) imaging has been utilized to map the internal electric and…
